Validation of terahertz coating thickness measurements using X-ray microtomography

I.S. Russe, D. Brock, K. Knop, P. Kleinebudde and J.A. Zeitler, Validation of terahertz coating thickness measurements using X-ray microtomography, Molecular Pharmaceutics, doi: 10.1021/mp300383y, in press (2013).

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